Test and Measurement Equipment

WHITE PAPERS AND CASE STUDIES

ISO Compliance Of Non-Contact, Real-Time Beam Analysis
ISO Compliance Of Non-Contact, Real-Time Beam Analysis To deliver continuously high product quality, the key parameters of laser beams in production applications must be measured on a regular basis. Ophir has tackled the task and developed a non-contact measurement technology, the BeamWatch, based on the Rayleigh scattering.   Continue Reading...
Radiometry 101
Radiometry 101 Radiometry is the science of studying the transport of energy through radiation. In this article, Telops presents the basics of the principal laws of radiometry as seen through light-sensitive instruments.  Continue Reading...
New Tool Measures 4 Surface Appearance Quality Conditions Simultaneously
New Tool Measures 4 Surface Appearance Quality Conditions Simultaneously If surface appearance quality is critical to your product, learn about a new manufacturing-friendly tool that allows you to establish numerical standards for and measure four conditions of surface quality: gloss, haze, image clarity, and BRDF including Canon’s new parameter “Scattering C20, C60.”   Continue Reading...
Achieving Standardized Measurements With BeamWatch AM The BeamWatch AM is Ophir-Spiricon’s beam monitoring system designed specifically for use in the additive manufacturing industry to provide non-interfering real-time beam measurement at the location of the working plane.   Continue Reading...
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TEST AND MEASUREMENT EQUIPMENT PRODUCTS

InGaAs Camera-Based Beam Profiling Systems For Eye-Safe Military, Telecom, And Medical Laser Applications InGaAs Camera-Based Beam Profiling Systems For Eye-Safe Military, Telecom, And Medical Laser Applications

The Ophir® SP1201 and SP1203 are compact, InGaAs camera-based beam profiling systems designed specifically for real-time viewing and measuring of the optical performance of laser beams. The SP1201 features a QVGA resolution InGaAs camera, and the SP1203 features a high-resolution VGA InGaAs camera, both for high sensitivity imaging.

High Resolution Beam Profiling Camera With USB 3.0 Interface For CW And Pulsed Lasers: Ophir® SP920 High Resolution Beam Profiling Camera With USB 3.0 Interface For CW And Pulsed Lasers: Ophir® SP920

The Ophir® SP920 USB 3.0 Silicon CCD High Resolution Beam Profiling Camera is designed to accurately capture and analyze wavelengths from 190 nm – 1100 nm, with enhanced sensitivity at 1070 nm. The camera features a wide dynamic range, excellent signal to noise ratio, USB 3.0 interface, and BeamGage® beam analysis software. It is ideal for measuring CW and pulsed laser profiles in such high-speed applications as medical imaging, microscopy, or micromachining.

Ophir FluxGage System For Measurement Of LED Luminaires With Low Total Luminous Flux Ophir FluxGage System For Measurement Of LED Luminaires With Low Total Luminous Flux

Measurements include total luminous flux (down to 20 lm), spectrum and color parameters (CCT, CRI, TM-30-15), and flicker for a variety of applications, including automotive, traffic lighting, life sciences, and medical.

Ruggedized Multi-Head High-Speed Camera System: FASTCAM MH6 Ruggedized Multi-Head High-Speed Camera System: FASTCAM MH6

Photron offers the new FASTCAM MH6 camera system perfectly designed for space- and weight-constrained environments, including in on-board vehicle safety testing and military testing applications. The MH6 camera head provides outstanding image quality with 1080 HD resolution at 1,000 frame per second and light sensitivity of ISO 5,000 color and ISO 12,500 monochrome.

Active Thermography Solutions: TESTD Series Active Thermography Solutions: TESTD Series

Telops’ TESTD Series offers nondestructive testing solutions for the evaluation of materials, components, and assemblies. These non-contact IR methods are based on active thermography to detect damage from corrosion, delamination, decay, voids, inclusions, and other irregularities.

Production Ready 3D Optical Profiler: ZeGage™ Pro Production Ready 3D Optical Profiler: ZeGage™ Pro

The ZeGage™ Pro and ZeGage™ Pro HR are scanning white light interferometers that provide 3D optical surface profiling for the measurement of precision surfaces that require non-contact metrology. The base ZeGage™ Pro model delivers surface mapping at the nanometer scale, meeting the needs for most industrial surfaces. For smoother samples with a much finer surface finish, the ZeGage™ Pro HR offers more than 20X higher precision with 0.15 nm vertical precision.

Compact, All-In-One LED Luminaire Measurement System: FluxGage Compact, All-In-One LED Luminaire Measurement System: FluxGage

The FluxGage is Ophir’s new compact measuring system for LED Luminaires that measures their total flux, color (CCT, CRI, Duv, chromaticity), and flicker. The system measures the total flux using solar panels instead of an integrating sphere, delivering the same functionality in one-third the size. 

Ophir® Power Meter For Fluorescence Microscopy: PD300-MS Ophir® Power Meter For Fluorescence Microscopy: PD300-MS

The new Ophir® PD300-MS microscope slide power meter designed to make accurate measurements of emitted light from fluorescent microscopes. Measuring power levels of high numerical aperture (NA) objectives, from 5 µW to 1 W, this power meter can be used with a wide range of light sources in such applications as photo-activation or photo-bleaching.

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TEST AND MEASUREMENT EQUIPMENT VIDEOS

  • Low Power Measurements: Best Practices
    Low Power Measurements: Best Practices

    Measuring very low power beams of light can be tricky; even small values of noise, drift or offset can have major impact on your readings. In this video, we’ll look at some best practices that can help you get the best performance from your very low power measurements.

  • What Wavelength Range Should You Use?
    What Wavelength Range Should You Use?

    At Photonics West 2017, Greg Staples focused on selecting different wavelengths for specific applications. Watch the video for wavelength selection guidance for precision agriculture, food sorting, mining, pharmaceutical quality control, and more.

  • Product Video: Surface Metrology In Adverse Environments
    Product Video: Surface Metrology In Adverse Environments

    This year at Photonics West, Erin McDonnel and Eric Felkel with Zygo gave us a glimpse into how their interferometers can be used to perform accurate surface metrology in adverse environments (like a trade show floor).

  • Co-alignment Of Visible, NIR, And IR Laser Beams
    Co-alignment Of Visible, NIR, And IR Laser Beams

    Eric Craven with Ophir Photonics provided us with a tutorial at DCS 2016 on how to co-align visible, near-infrared, and infrared laser beams through the use of a pyroelectric camera array coupled with beam profiling software.

  • An Intro To Advanced Hyperspectral Imaging
    An Intro To Advanced Hyperspectral Imaging

    Hyperspectral imaging technology has advanced significantly in the last 50 years, and Greg Staples with Bayspec talked with us for a few minutes at the 2016 SPIE DCS exhibition about how it has changed.

  • Measurements Across A Wide Spatial Frequency Domain
    Measurements Across A Wide Spatial Frequency Domain

    At Zygo' booth this year, Tyler Steele introduced us to the Verifire™ series of interferometers for the measurement of plano, spherical and aspherical surfaces and material characteristics. He then turned it over to Eric Felkel who showed us the Nomad™, a portable optical profiler for measuring topography and roughness on optical surfaces.

  • Why Do I Need To Measure My Laser Beam?
    Why Do I Need To Measure My Laser Beam?

    Dan Ford walked us through some of what was on display for laser beam profiling and analysis applications before sharing information on Ophir’s high-power laser application initiative over the last year.

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