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Ophir® Focal Spot Analyzer For Monitoring Material Processing Laser Performance

Source: Ophir Photonics

Ophir® Focal Spot Analyzer For Monitoring Material Processing Laser Performance

The new Ophir® Focal Spot Analyzer is a laser beam monitoring system designed to measure the focus spot and power of high power lasers in real time. Capable of measurement of focal sizes down to 35 µm and laser power from less than 1 to 400 Watts for wavelengths from 266 – 1100 nm, these analyzers are ideal for laser applications with shorter working distances.

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The Focal Spot Analyzer system monitors power density distribution of the focal spot as well as shifts in the focal plane location. This device is so accurate that the distance to the camera array is NIST traceable, which is necessary for applications requiring a focused spot of light with a well-defined, narrow, and reproducible bandwidth and intensity profile. Included is a high resolution SP928 CCD Beam Profiling Camera or the LT665 Large Array Beam Profiling Camera, LBS-300s beam attenuator system with two beam splitters, BeamGage® beam profiling software, and a calibration certificate.

For additional features, specifications, and operational characteristics, download the above datasheet.

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