White Paper

Achieving Standardized Measurements With BeamWatch AM

Source: Ophir Photonics

The BeamWatch AM is Ophir-Spiricon’s beam monitoring system designed specifically for use in the additive manufacturing industry to provide non-interfering real-time beam measurement at the location of the working plane. This white paper delivers a comparison of results with those from the NanoScan 2, a widely-accepted scanning-slit technology, and demonstrates that the BeamWatch AM can achieve ISO-compliant measurements when correctly used. For more information on achieving standardized measurements with the BeamWatch AM, download the full paper.

VIEW THE WHITE PAPER!
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